020 -- Calculating the E-Field Inside a Time-of-Flight Detector

Research is underway at SUNY Geneseo’s Low Energy Ion Facility (LEIF) with the goal of understanding material composition using Rutherford backscattering spectroscopy (RBS) techniques. Low energy ions are well suited to understanding the elemental composition of targets also fabricated within the same facility. Time-of-Flight (TOF) spectroscopy may be used to analyze materials to a high degree of precision and for a relatively low cost-basis. Many parts within a TOF detector are biased to some voltage to attract the backscattered alpha particles. The resulting electric fields inside the TOF detector could potentially deflect alpha particles away from their intended target. Computational models have been built to determine the extent of alpha deflection within the chamber and give predictive measurements for the expected alpha flight time.